Siegmund, David <br/><br/>
Sequential analysis  : tests and confidence intervals 

 - New York  Springer-Verlag  1985 
 -  xi, 272p. 
<br/><br/> Includes bibliography and index 
<br/><br/><br/>eng 
<br/><br/><label>ISBN: </label>0-387-96134-8 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Sequential analysis
<br/><br/><label>Dewey Class. No.: </label>519.2  / SIS