David, Rene <br/><br/>
Random testing of digital circuits  : theory and applications 
Rene' David 
 - New York:  Marcel Dekker,  1998. 
 - xix, 475p. 
<br/><br/> HB 
<br/><br/><br/>Eng 
<br/><br/><label>ISBN: </label>0824701828 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Digital integrated ciruits-Testing
<br/><br/><label>Dewey Class. No.: </label>621.3815  / DAR