Electromigration and electronic device degradation 
edited by Aris Christou 
 - New York:  John Weiley and Sons,  1994. 
 - xiv, 343p. 
<br/><br/> HB 
<br/><br/><br/>Eng 
<br/><br/><label>ISBN: </label>0471584894 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Semiconductors-Failures<br/>Integrated circuits-Deterioration<br/>Electrodiffusion
<br/><br/><label>Dewey Class. No.: </label>621.3815  / ELE