Huisman, Leendert M. <br/><br/>
Data mining and diagnosing ic fails 
Leendert M. Huisman 
 - New York:  Springer,  2005. 
 - xiv, 270p. 
<br/><br/> HB 
<br/><br/><br/>Eng 
<br/><br/><label>ISBN: </label>0387249931 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Data mining<br/>Integrated circuits-Testing-Statistical methods<br/>Semiconductors-Failures <br/>Data mining 
<br/><br/><label>Dewey Class. No.: </label>621.381548  / HUD