Voigtlander, Bert <br/><br/>
Atomic force microscopy 
Bert Voigtlander 
 - 2nd ed. 
 - Switzerland:  Springer Nature,  2019. 
 - xiv, 331p. 
<br/><br/> HB 
<br/><br/><br/>Eng 
<br/><br/><label>ISBN: </label>9783030136536 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Nanotechnology<br/>Engineering<br/>Microscopy
<br/><br/><label>Dewey Class. No.: </label>502.82  / VOA