000 00429 a2200169 4500
020 _a0340677716
082 _a621.381
_bBUM
100 _aBuchanan,W
_981562
245 _aMicroelectronic systems
_b: design, modelling and testing
_cW Buchanan
260 _aLondon:
_bArnold,
_c1997.
300 _bxiv, 314p.
500 _aPB
546 _aEng
650 _aMicroelectronics
_981563
700 _aBuchanan,W
_981564
942 _cBK
999 _c18135
_d18135