| 000 | 00555 a2200193 4500 | ||
|---|---|---|---|
| 020 | _a0387249931 | ||
| 082 |
_a621.381548 _bHUD |
||
| 100 |
_aHuisman, Leendert M. _9170113 |
||
| 245 |
_aData mining and diagnosing ic fails _cLeendert M. Huisman |
||
| 260 |
_aNew York: _bSpringer, _c2005. |
||
| 300 | _axiv, 270p. | ||
| 500 | _aHB | ||
| 546 | _aEng | ||
| 650 |
_aData mining _9170114 |
||
| 650 |
_aIntegrated circuits-Testing-Statistical methods _9170115 |
||
| 650 |
_aSemiconductors-Failures _9170116 |
||
| 650 |
_aData mining _9170117 |
||
| 942 | _cBK | ||
| 999 |
_c26918 _d26918 |
||