| 000 | 02839 a2200397 4500 | ||
|---|---|---|---|
| 020 | _a0387465464 | ||
| 082 | 0 | 4 |
_a621 _bSAD |
| 100 | 1 |
_aSachdev, Manoj _973355 |
|
| 245 | 1 | 0 |
_aDefect-oriented testing for nano-metric cmos vlsi circuits _cManoj Sachdev. |
| 250 | _a2nd ed. | ||
| 260 |
_aDordrecht : _bSpringer, _c2007. |
||
| 300 | _axxi, 328p. | ||
| 500 | _aHB | ||
| 520 | _aFailures of nano-metric technologies owing to defects and shrinking process tolerances give rise to significant challenges for IC testing. As the variation of fundamental parameters such as channel length, threshold voltage, thin oxide thickness and interconnect dimensions goes well beyond acceptable limits, new test methodologies and a deeper insight into the physics of defect-fault mappings are needed. In Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits state of the art of defect-oriented testing is presented from both a theoretical approach as well as from a practical point of view. Step-by-step handling of defect modeling, defect-oriented testing, yield modeling and its usage in common economics practices enables deeper understanding of concepts. The progression developed in this book is essential to understand new test methodologies, algorithms and industrial practices. Without the insight into the physics of nano-metric technologies, it would be hard to develop system-level test strategies that yield a high IC fault coverage. Obviously, the work on defect-oriented testing presented in the book is not final, and it is an evolving field with interesting challenges imposed by the ever-changing nature of nano-metric technologies. Test and design practitioners from academia and industry will find that Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits lays the foundations for further pioneering work. | ||
| 546 | _aEng | ||
| 650 | 4 |
_aCircuits & components. _92635 |
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| 650 | 4 |
_aMathematics and Science. _961627 |
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| 650 | 4 |
_aTechnology & Engineering. _973356 |
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| 650 | 4 |
_aTechnology & Industrial Arts. _996 |
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| 650 | 4 |
_aScience/Mathematics. _973357 |
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| 650 | 4 |
_aElectricity. _973358 |
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| 650 | 4 |
_aElectronics - Circuits - General. _973359 |
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| 650 | 4 |
_aEngineering - Electrical & Electronic. _9458 |
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| 650 | 4 |
_aIndustrial Design - General. _973360 |
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| 650 | 4 |
_aTechnology / Electronics / Circuits / General. _973361 |
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| 650 | 4 |
_aTechnology / Electronics / Microelectronics. _973362 |
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| 650 | 4 |
_aTechnology / Engineering / Electrical. _973363 |
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| 650 | 4 |
_aTechnology / Industrial Design / General. _973364 |
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| 650 | 4 |
_aDefects. _973365 |
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| 650 | 4 |
_aIntegrated circuits. _973366 |
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| 650 | 4 |
_aMetal oxide semiconductors, Complementary. _973367 |
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| 650 | 4 |
_aTesting. _973368 |
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| 650 | 4 |
_aVery large scale integration. _973369 |
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| 700 | 1 |
_aGyvez, Jose pineda (jt. auth.) _973370 |
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| 942 | _cBK | ||
| 999 |
_c32734 _d32734 |
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