000			01389 a2200217 4500
020			_a1580536921
020			_a9781580536929
082	0	4	_a621.384134 _bSCP
100	1		_aSchaub, Keith B. _998986
245	1	0	_aProduction testing of RF and system-on-a-chip devices for wireless communications / _cKeith B. Schaub.
260			_aBoston : _bArtech House Publishers, _c2004.
300			_axviii, 272p.
490	1		_aArtech house microwave library.
500			_aHB
520			_aWith the increasing number of integrated wireless devices being developed with SOC (system on a chip) technology, a merger of RF and mixed-signal test approaches is quickly becoming a necessity. Addressing this need head-on, this first-of-its-kind resource offers you an in-depth overview of RF and SOC product testing for wireless communications. The book introduces new, creative methods that lead to more efficient testing, such as multi-site and parallel testing. You learn how to determine critical measurements for specific applications, including Bluetooth, WLAN, and 3G devices. Moreover, the book shows you how to perform these measurements cost effectively in a production test environment.
546			_aEng
650			_aSemiconductors-Testing _985815
650			_aWireless communication systems-Equipment and supplies-Testing _998987
700			_aKelly, Joe (jt. auth.) _998988
942			_cBK
999			_c54597 _d54597