| 000 | 00428nam a2200157Ia 4500 | ||
|---|---|---|---|
| 020 | _a0824701828 | ||
| 082 |
_a621.3815 _bDAR |
||
| 100 |
_aDavid, Rene _985616 |
||
| 245 |
_aRandom testing of digital circuits _b: theory and applications _cRene' David |
||
| 260 |
_aNew York: _bMarcel Dekker, _c1998. |
||
| 300 | _axix, 475p. | ||
| 500 | _aHB | ||
| 546 | _aEng | ||
| 650 |
_aDigital integrated ciruits-Testing _985617 |
||
| 942 | _cBK | ||
| 999 |
_c7640 _d7640 |
||