| 000 | 00530nam a2200181Ia 4500 | ||
|---|---|---|---|
| 020 | _a0471584894 | ||
| 082 |
_a621.3815 _bELE |
||
| 245 |
_aElectromigration and electronic device degradation _cedited by Aris Christou |
||
| 260 |
_aNew York: _bJohn Weiley and Sons, _c1994. |
||
| 300 | _axiv, 343p. | ||
| 500 | _aHB | ||
| 546 | _aEng | ||
| 650 |
_aSemiconductors-Failures _985637 |
||
| 650 |
_aIntegrated circuits-Deterioration _985638 |
||
| 650 |
_aElectrodiffusion _985639 |
||
| 700 |
_aChristou,Aris (ed.) _985640 |
||
| 942 | _cBK | ||
| 999 |
_c7641 _d7641 |
||