000 00464nam a2200157Ia 4500
020 _a0442006438
082 _a621.381548
_bHND
100 _aHnatek, Eugene R.
_981705
245 _aDigital integrated circuit testing from a quality perspective
_cEugene R. Hnatek
260 _aNew York:
_bVan Nostrand Reinhold,
_c1993.
300 _ax, 179p.
500 _aHB
546 _aEng
650 _aDigital integrated circuits-Testing-Quality control
_985811
942 _cBK
999 _c7657
_d7657