| 000 | 00407nam a2200157Ia 4500 | ||
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| 020 | _a0750694726 | ||
| 082 |
_a621.381548 _bAMP |
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| 100 |
_aAmir, Afshar _985814 |
||
| 245 |
_aPrinciples of semiconductor network testing _cAmir Afshar |
||
| 260 |
_aBoston: _bButterworth-Heinemann, _c1995. |
||
| 300 | _axiv, 213p. | ||
| 500 | _aHB | ||
| 546 | _aEng | ||
| 650 |
_aSemiconductors-Testing _985815 |
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| 942 | _cBK | ||
| 999 |
_c7707 _d7707 |
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