000 00423nam a2200157Ia 4500
020 _a0-387-96134-8
082 _a519.2
_bSIS
100 _aSiegmund, David
_916781
245 _aSequential analysis
_b: tests and confidence intervals
260 _aNew York
_bSpringer-Verlag
_c1985
300 _bxi, 272p.
500 _aIncludes bibliography and index
546 _aeng
650 _aSequential analysis
_916782
942 _cBK
999 _c9171
_d9171