Siegmund, David

Sequential analysis : tests and confidence intervals - New York Springer-Verlag 1985 - xi, 272p.

Includes bibliography and index


eng

0-387-96134-8


Sequential analysis

519.2 / SIS

Copyright © 2023, All rights reserved
AIOU, Islamabad Pakistan.
Ph#: | 051-9250040, 051-9571682, 051-9571695 Fax: | 051-9250146 Email| documentdelivery@aiou.edu.pk Web| ”Central Library”