Siegmund, David
Sequential analysis : tests and confidence intervals - New York Springer-Verlag 1985 - xi, 272p.
Includes bibliography and index
eng
0-387-96134-8
Sequential analysis
519.2 / SIS
Sequential analysis : tests and confidence intervals - New York Springer-Verlag 1985 - xi, 272p.
Includes bibliography and index
eng
0-387-96134-8
Sequential analysis
519.2 / SIS