| 000 -LEADER |
|---|
| fixed length control field |
00457nam a2200169Ia 4500 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| International Standard Book Number |
7484-0968-8 |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER |
|---|
| Classification number |
502.825 |
| Item number |
GOE |
| 100 ## - MAIN ENTRY--PERSONAL NAME |
|---|
| Personal name |
Goodhew, Peter J. |
| 9 (RLIN) |
14236 |
| 245 ## - TITLE STATEMENT |
|---|
| Title |
Electron microscopy and analysis |
| Statement of responsibility, etc. |
Peter J. Goodhew |
| 250 ## - EDITION STATEMENT |
|---|
| Edition statement |
3rd |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) |
|---|
| Place of publication, distribution, etc. |
London |
| Name of publisher, distributor, etc. |
Taylor & Francis |
| Date of publication, distribution, etc. |
2001 |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Other physical details |
vii, 251p |
| 500 ## - GENERAL NOTE |
|---|
| General note |
Includes bibliographical references and index |
| 546 ## - LANGUAGE NOTE |
|---|
| Language note |
eng |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name as entry element |
Electron microscopy |
| 9 (RLIN) |
14237 |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) |
|---|
| Koha item type |
Books |