Principles of semiconductor network testing (Record no. 7707)

000 -LEADER
fixed length control field 00407nam a2200157Ia 4500
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
ISBN 0750694726
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.381548
Item number AMP
100 ## - MAIN ENTRY--AUTHOR NAME
Personal name Amir, Afshar
245 ## - TITLE STATEMENT
Title Principles of semiconductor network testing
Statement of responsibility, etc Amir Afshar
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Place of publication Boston:
Name of publisher Butterworth-Heinemann,
Year of publication 1995.
300 ## - PHYSICAL DESCRIPTION
Number of Pages xiv, 213p.
500 ## - GENERAL NOTE
General note HB
546 ## - LANGUAGE NOTE
Language note Eng
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical Term Semiconductors-Testing
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Books
Holdings
Price effective from Permanent Location Not for loan Date acquired Koha item type Accession Number Lost status Damaged status Shelving location Withdrawn status Current Location Full call number
2016-08-16Central Library AIOU Islamabad 1999-06-02Books86597  General Stacks Central Library AIOU Islamabad621.381548 AMP

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