Normal view
MARC view
- Semiconductor--metal boundries
Entry Topical Term
Used in 0 records
001 - CONTROL NUMBER
- control field: 283473
003 - CONTROL NUMBER IDENTIFIER
- control field: OSt
005 - DATE AND TIME OF LATEST TRANSACTION
- control field: 20230112092315.0
008 - FIXED-LENGTH DATA ELEMENTS
- fixed length control field: 230112|| aca||aabn | a|a d
040 ## - CATALOGING SOURCE
- Original cataloging agency: OSt
- Transcribing agency: OSt
150 ## - HEADING--TOPICAL TERM
- Topical term or geographic name entry element: Semiconductor--metal boundries
670 ## - SOURCE DATA FOUND
- Source citation: Work cat.: (OSt)159654: Kanwal Farooq Kyani 283472, Effect of strain and external electric field on schottky barrier height of graphene based janus heterostructure, 2022.