Entry Topical Term

Used in 1 records

001 - CONTROL NUMBER

• control field: 73359

003 - CONTROL NUMBER IDENTIFIER

• control field: OSt

005 - DATE AND TIME OF LATEST TRANSACTION

• control field: 20160405092142.0

008 - FIXED-LENGTH DATA ELEMENTS

• fixed length control field: 160405|| aca||aabn | a|a d

040 ## - CATALOGING SOURCE

• Original cataloging agency: OSt
• Transcribing agency: OSt

150 ## - HEADING--TOPICAL TERM

• Topical term or geographic name entry element: Electronics - Circuits - General.

670 ## - SOURCE DATA FOUND

• Source citation: Work cat.: (OSt)32734: Sachdev, Manoj 73355, Defect-oriented testing for nano-metric cmos vlsi circuits , 2007.