Normal view MARC view
  • Technology / Industrial Design / General.

Technology / Industrial Design / General. (Topical Term)

Used in 1 records
Preferred form: Technology / Industrial Design / General.

Machine generated authority record.

Work cat.: (OSt)32734: Sachdev, Manoj 73355, Defect-oriented testing for nano-metric cmos vlsi circuits , 2007.


Copyright © 2023, All rights reserved
AIOU, Islamabad Pakistan.
Ph#: | 051-9250040, 051-9571682, 051-9571695 Fax: | 051-9250146 Email| documentdelivery@aiou.edu.pk Web| ”Central Library”