Normal view
MARC view
- Gyvez, Jose pineda (jt. auth.)
Entry Personal Name
Used in 1 records
001 - CONTROL NUMBER
- control field: 73370
003 - CONTROL NUMBER IDENTIFIER
- control field: OSt
005 - DATE AND TIME OF LATEST TRANSACTION
- control field: 20160405092142.0
008 - FIXED-LENGTH DATA ELEMENTS
- fixed length control field: 160405|| aca||aabn | a|a d
040 ## - CATALOGING SOURCE
- Original cataloging agency: OSt
- Transcribing agency: OSt
100 ## - HEADING--PERSONAL NAME
- Personal name: Gyvez, Jose pineda (jt. auth.)
670 ## - SOURCE DATA FOUND
- Source citation: Work cat.: (OSt)32734: Sachdev, Manoj 73355, Defect-oriented testing for nano-metric cmos vlsi circuits , 2007.