Normal view MARC view
  • Digital integrated circuits-Testing-Quality control

Digital integrated circuits-Testing-Quality control (Topical Term)

Used in 1 records
Preferred form: Digital integrated circuits-Testing-Quality control

Machine generated authority record.

Work cat.: (OSt)7657: Hnatek, Eugene R. 81705, Digital integrated circuit testing from a quality perspective, 1993.


Copyright © 2023, All rights reserved
AIOU, Islamabad Pakistan.
Ph#: | 051-9250040, 051-9571682, 051-9571695 Fax: | 051-9250146 Email| documentdelivery@aiou.edu.pk Web| ”Central Library”