Electromigration and electronic device degradation edited by Aris Christou

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Material type: Text

TextPublication details: New York: John Weiley and Sons, 1994.Description: xiv, 343pISBN:

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Holdings
Item type	Current library	Call number	Status	Date due	Barcode
Books	Central Library Allama Iqbal Open University Islamabad General Stacks	621.3815 ELE (Browse shelf(Opens below))	Available		87223

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Previous	621.3815 CRT Transistors	621.3815 DAM Microwave semiconductor circuit design	621.3815 DAR Random testing of digital circuits : theory and applications	621.3815 ELE Electromigration and electronic device degradation	621.3815 FAA Adaptive techniques for mixed signal system on chip	621.3815 FLE Electronic devices	621.3815 FLE Electronic devices : conventional current version	Next

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