Principles of semiconductor network testing Amir Afshar

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Material type: Text

TextPublication details: Boston: Butterworth-Heinemann, 1995.Description: xiv, 213pISBN:

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Holdings
Item type	Current library	Call number	Status	Date due	Barcode
Books	Central Library Allama Iqbal Open University Islamabad General Stacks	621.381548 AMP (Browse shelf(Opens below))	Available		86597

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Previous	621.38154 OPN Noise in instrumentation systems : instrumentation units 11,12 and 13	621.38154 OPT Transducers 2 acceleration, vibration, velocity, flow :Instrumentation unit 8/9/10	621.38154 OPT Transducers 1 temperature,displacement,force,torque,pressure : instrumentation unit 3 and 4	621.381548 AMP Principles of semiconductor network testing	621.381548 HND Digital integrated circuit testing from a quality perspective	621.381548 HUD Data mining and diagnosing ic fails	621.381548 ROU Use of the oscilloscope : a programmed text	Next

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