Production testing of RF and system-on-a-chip devices for wireless communications / Keith B. Schaub.

By:

Schaub, Keith B

Contributor(s):

Kelly, Joe (jt. auth.)

Series: Publication details: Boston : Artech House Publishers, 2004.Description: xviii, 272pISBN:

1580536921
9781580536929

Subject(s):

DDC classification:

621.384134 SCP

Summary: With the increasing number of integrated wireless devices being developed with SOC (system on a chip) technology, a merger of RF and mixed-signal test approaches is quickly becoming a necessity. Addressing this need head-on, this first-of-its-kind resource offers you an in-depth overview of RF and SOC product testing for wireless communications. The book introduces new, creative methods that lead to more efficient testing, such as multi-site and parallel testing. You learn how to determine critical measurements for specific applications, including Bluetooth, WLAN, and 3G devices. Moreover, the book shows you how to perform these measurements cost effectively in a production test environment.

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Holdings
Item type	Current library	Call number	Status	Date due	Barcode
Books	Central Library Allama Iqbal Open University Islamabad General Stacks	621.384134 SCP (Browse shelf(Opens below))	Available		110645

With the increasing number of integrated wireless devices being developed with SOC (system on a chip) technology, a merger of RF and mixed-signal test approaches is quickly becoming a necessity. Addressing this need head-on, this first-of-its-kind resource offers you an in-depth overview of RF and SOC product testing for wireless communications. The book introduces new, creative methods that lead to more efficient testing, such as multi-site and parallel testing. You learn how to determine critical measurements for specific applications, including Bluetooth, WLAN, and 3G devices. Moreover, the book shows you how to perform these measurements cost effectively in a production test environment.

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