Atomic force microscopy Bert Voigtlander

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TextPublication details: Switzerland: Springer Nature, 2019.Edition: 2nd edDescription: xiv, 331pISBN:

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Item type	Current library	Call number	Status	Date due	Barcode
Books	Central Library Allama Iqbal Open University Islamabad General Stacks	502.82 VOA (Browse shelf(Opens below))	Available		125958

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Previous	502.8 SCI Science equipment manual for colleges	502.82 MOH Hybridizing surface probe microscopies : toward a full description of the meso- and Nanoworlds	502.82 PAN Near-Field optics : theory, instrumentation, and applications	502.82 VOA Atomic force microscopy	502.825 GOE Electron microscopy and analysis	502.825 IND Industrial applications of electron microscopy	502.85 SCI Scientific data management : : challenges, technology, and deployment	Next

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