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1.
Digital integrated circuit testing from a quality perspective Eugene R. Hnatek by
Material type: Text Text
Publication details: New York: Van Nostrand Reinhold, 1993
Availability: Items available for loan: Central Library Allama Iqbal Open University Islamabad (1)Call number: 621.381548 HND.

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2.
Practical reliability of electronic equipment and products Eugene R. Hnatek by
Publication details: New York: Marcel Dekker, 2003
Availability: Items available for loan: Central Library Allama Iqbal Open University Islamabad (1)Call number: 621.381 HNP.

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