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1.
Defect-oriented testing for nano-metric cmos vlsi circuits

by Sachdev, Manoj; Gyvez, Jose pineda (jt. auth.).

Edition: 2nd ed. Publisher: Dordrecht : Springer, 2007Availability: Items available for loan: Central Library AIOU Islamabad (1). Location(s): General Stacks 621 SAD.

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2.
Broadband fixed wireless access : a system perspective

by Engels, Marc; Petre, Frederik (jt. auth.).

Publisher: New York: Springer, 2006Availability: Items available for loan: Central Library AIOU Islamabad (1). Location(s): General Stacks 621 ENB.

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3.
Lead-free soldering

by Bath, Jasbir (ed.).

Publisher: New York: Springer, 2007Availability: Items available for loan: Central Library AIOU Islamabad (1). Location(s): General Stacks 621.38104 LEA.

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