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1.
Principles of semiconductor network testing

by Amir, Afshar.

Material type: book Book Publisher: Boston: Butterworth-Heinemann, 1995Availability: Items available for loan: Central Library AIOU Islamabad (1). Location(s): General Stacks 621.381548 AMP.

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2.
Production testing of RF and system-on-a-chip devices for wireless communications

by Schaub, Keith B; Kelly, Joe (jt. auth.).

Publisher: Boston : Artech House Publishers, 2004Availability: Items available for loan: Central Library AIOU Islamabad (1). Location(s): General Stacks 621.384134 SCP.

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