Schaub, Keith B.

Production testing of RF and system-on-a-chip devices for wireless communications / Keith B. Schaub. - Boston : Artech House Publishers, 2004. - xviii, 272p. - Artech house microwave library. .

HB

With the increasing number of integrated wireless devices being developed with SOC (system on a chip) technology, a merger of RF and mixed-signal test approaches is quickly becoming a necessity. Addressing this need head-on, this first-of-its-kind resource offers you an in-depth overview of RF and SOC product testing for wireless communications. The book introduces new, creative methods that lead to more efficient testing, such as multi-site and parallel testing. You learn how to determine critical measurements for specific applications, including Bluetooth, WLAN, and 3G devices. Moreover, the book shows you how to perform these measurements cost effectively in a production test environment.


Eng

1580536921 9781580536929


Semiconductors-Testing
Wireless communication systems-Equipment and supplies-Testing

621.384134 / SCP

Copyright © 2023, All rights reserved
AIOU, Islamabad Pakistan.
Ph#: | 051-9250040, 051-9571682, 051-9571695 Fax: | 051-9250146 Email| documentdelivery@aiou.edu.pk Web| ”Central Library”