000 -LEADER |
fixed length control field |
01389 a2200217 4500 |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
ISBN |
1580536921 |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
ISBN |
9781580536929 |
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER |
Classification number |
621.384134 |
Item number |
SCP |
100 1# - MAIN ENTRY--AUTHOR NAME |
Personal name |
Schaub, Keith B. |
245 10 - TITLE STATEMENT |
Title |
Production testing of RF and system-on-a-chip devices for wireless communications / |
Statement of responsibility, etc |
Keith B. Schaub. |
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) |
Place of publication |
Boston : |
Name of publisher |
Artech House Publishers, |
Year of publication |
2004. |
300 ## - PHYSICAL DESCRIPTION |
Number of Pages |
xviii, 272p. |
490 1# - SERIES STATEMENT |
Series statement |
Artech house microwave library. |
500 ## - GENERAL NOTE |
General note |
HB |
520 ## - SUMMARY, ETC. |
Summary, etc |
With the increasing number of integrated wireless devices being developed with SOC (system on a chip) technology, a merger of RF and mixed-signal test approaches is quickly becoming a necessity. Addressing this need head-on, this first-of-its-kind resource offers you an in-depth overview of RF and SOC product testing for wireless communications. The book introduces new, creative methods that lead to more efficient testing, such as multi-site and parallel testing. You learn how to determine critical measurements for specific applications, including Bluetooth, WLAN, and 3G devices. Moreover, the book shows you how to perform these measurements cost effectively in a production test environment. |
546 ## - LANGUAGE NOTE |
Language note |
Eng |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical Term |
Semiconductors-Testing |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical Term |
Wireless communication systems-Equipment and supplies-Testing |
700 ## - ADDED ENTRY--PERSONAL NAME |
Personal name |
Kelly, Joe (jt. auth.) |
942 ## - ADDED ENTRY ELEMENTS (KOHA) |
Koha item type |
Books |