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Electromigration and electronic device degradation edited by Aris Christou - New York: John Weiley and Sons, 1994. - xiv, 343p.

HB

Eng

ISBN: 0471584894

Subjects--Topical Terms:
Semiconductors-Failures
Integrated circuits-Deterioration
Electrodiffusion

Dewey Class. No.: 621.3815 / ELE

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