| 000 -LEADER |
|---|
| fixed length control field |
00530nam a2200181Ia 4500 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| ISBN |
0471584894 |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER |
|---|
| Classification number |
621.3815 |
| Item number |
ELE |
| 245 ## - TITLE STATEMENT |
|---|
| Title |
Electromigration and electronic device degradation |
| Statement of responsibility, etc |
edited by Aris Christou |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) |
|---|
| Place of publication |
New York: |
| Name of publisher |
John Weiley and Sons, |
| Year of publication |
1994. |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Number of Pages |
xiv, 343p. |
| 500 ## - GENERAL NOTE |
|---|
| General note |
HB |
| 546 ## - LANGUAGE NOTE |
|---|
| Language note |
Eng |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical Term |
Semiconductors-Failures |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical Term |
Integrated circuits-Deterioration |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical Term |
Electrodiffusion |
| 700 ## - ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
Christou,Aris (ed.) |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) |
|---|
| Koha item type |
Books |