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Hnatek, Eugene R.

Digital integrated circuit testing from a quality perspective Eugene R. Hnatek - New York: Van Nostrand Reinhold, 1993. - x, 179p.

HB

Eng

ISBN: 0442006438

Subjects--Topical Terms:
Digital integrated circuits-Testing-Quality control

Dewey Class. No.: 621.381548 / HND

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