AIOU Library

Your cart is empty.
Normal view MARC view ISBD view

Digital integrated circuit testing from a quality perspective

by Hnatek, Eugene R.
Material type: materialTypeLabelBookPublisher: New York: Van Nostrand Reinhold, 1993Description: x, 179p.ISBN: 0442006438.Subject(s): Digital integrated circuits-Testing-Quality control
Tags from this library: No tags from this library for this title.
    average rating: 0.0 (0 votes)
Item type Location Call number Status Date due Barcode Item holds
Books
Central Library AIOU Islamabad

Allama Iqbal Open University

Central Library

General Stacks 		621.381548 HND (Browse shelf) Available 87147
Total holds: 0

HB

Eng

There are no comments for this item.

Log in to your account to post a comment.

Copyright © 2023, All rights reserved
AIOU, Islambad Pakistan.
Ph#: | 051-9250040, 051-9571692, 051-9571695 Fax: | 051-9250146 Email| documentdelivery@aiou.edu.pk Web| ”Central Library”