Characterization in silicon processing (Record no. 7631)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00402nam a2200157Ia 4500 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| ISBN | 0750691727 |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 620.193 |
| Item number | STC |
| 100 ## - MAIN ENTRY--AUTHOR NAME | |
| Personal name | Strausser, Yale |
| 245 ## - TITLE STATEMENT | |
| Title | Characterization in silicon processing |
| Statement of responsibility, etc | Yale Strausser |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
| Place of publication | Boston: |
| Name of publisher | Butterworth-Heinemann, |
| Year of publication | 1993. |
| 300 ## - PHYSICAL DESCRIPTION | |
| Other physical details | xiii, 240p. |
| 500 ## - GENERAL NOTE | |
| General note | HB |
| 546 ## - LANGUAGE NOTE | |
| Language note | Eng |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical Term | Surface chemistry |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Koha item type | Books |
| Price effective from | Permanent Location | Not for loan | Date acquired | Koha item type | Accession Number | Lost status | Damaged status | Shelving location | Withdrawn status | Current Location | Full call number |
|---|---|---|---|---|---|---|---|---|---|---|---|
| 2016-03-31 | Central Library AIOU Islamabad | 1999-08-21 | Books | 87142 | General Stacks | Central Library AIOU Islamabad | 620.193 STC |