Characterization in silicon processing
by Strausser, Yale.
Material type: BookPublisher: Boston: Butterworth-Heinemann, 1993Description: xiii, 240p.ISBN: 0750691727.Subject(s): Surface chemistryItem type | Location | Call number | Status | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|
Books |
Central Library AIOU Islamabad
General Stacks
Allama Iqbal Open UniversityCentral Library |
620.193 STC (Browse shelf) | Available | 87142 |
Total holds: 0
HB
Eng
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