Normal view
MARC view
- Digital integrated circuits-Testing-Quality control
Entry Topical Term
Used in 1 records
001 - CONTROL NUMBER
- control field: 85811
003 - CONTROL NUMBER IDENTIFIER
- control field: OSt
005 - DATE AND TIME OF LATEST TRANSACTION
- control field: 20160816093413.0
008 - FIXED-LENGTH DATA ELEMENTS
- fixed length control field: 160816|| aca||aabn | a|a d
040 ## - CATALOGING SOURCE
- Original cataloging agency: OSt
- Transcribing agency: OSt
150 ## - HEADING--TOPICAL TERM
- Topical term or geographic name entry element: Digital integrated circuits-Testing-Quality control
670 ## - SOURCE DATA FOUND
- Source citation: Work cat.: (OSt)7657: Hnatek, Eugene R. 81705, Digital integrated circuit testing from a quality perspective, 1993.