Atomic force microscopy
by
Voigtlander, Bert
.
Material type: 
BookPublisher: Switzerland: Springer Nature, 2019Edition: 2nd ed.Description: xiv, 331p.ISBN: 9783030136536.Subject(s): Nanotechnology | Engineering | Microscopy
| Item type | Location | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|
| Books |
Central Library AIOU Islamabad
General Stacks
Allama Iqbal Open UniversityCentral Library |
502.82 VOA (Browse shelf) | Available | 125958 |
Total holds: 0
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| 502.8 SCI Science equipment manual for colleges | 502.82 MOH Hybridizing surface probe microscopies | 502.82 PAN Near-Field optics | 502.82 VOA Atomic force microscopy | 502.825 GOE Electron microscopy and analysis | 502.825 IND Industrial applications of electron microscopy | 502.85 SCI Scientific data management : |
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