AIOU Library

Your cart is empty.
Normal view MARC view ISBD view

Digital circuit testing and testability

by Lala, Parag K.
Material type: materialTypeLabelBookPublisher: San Diego: Academic Press, 1997Description: xi,199p.ISBN: 0-12-434330-9.Subject(s): Integrated circuits-Fault tolerance
Tags from this library: No tags from this library for this title.
    average rating: 0.0 (0 votes)
Item type Location Call number Status Date due Barcode Item holds
Books
Central Library AIOU Islamabad

Allama Iqbal Open University

Central Library

General Stacks 		621.3950287 LAD (Browse shelf) Available 95883
Total holds: 0

Includes bibliography and index

eng

There are no comments for this item.

Log in to your account to post a comment.

Copyright © 2023, All rights reserved
AIOU, Islambad Pakistan.
Ph#: | 051-9250040, 051-9571692, 051-9571695 Fax: | 051-9250146 Email| documentdelivery@aiou.edu.pk Web| ”Central Library”