X-ray diffraction
by
Azaroff, Leonid V
; Kaplow, Roy (jt. auth); Kato, N.(jt. auth); Weiss, Richard J.(jt. auth); Wilson, A.J. C. V(jt. auth); Young, R.A. (jt. auth).
Material type: 
BookPublisher: New York: McGraw-Hill, 1974Description: 664p.ISBN: 0070026726.Subject(s): X-ray crystallography
| Item type | Location | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|
| Books |
Central Library AIOU Islamabad
General Stacks
Allama Iqbal Open UniversityCentral Library |
544.66 XRA (Browse shelf) | Available | 27192 |
Total holds: 0
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| 543.84 SPQ Quantitative thin-layer chromatography | 543.84 TUH High performance liquid chromatography in pesticide residue analysis | 543.84 WAT Thin layer chromatography : | 544.66 XRA X-ray diffraction | 544.834 FES Spot tests in inorganic analysis | 545 CHA Analytical chemistry | 545 CHA Analytical chemistry |
Includes index
eng
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