AIOU Library catalog › Results of search for 'an:"81705"'

	1.	Digital integrated circuit testing from a quality perspective by Hnatek, Eugene R. Material type: Book Publisher: New York: Van Nostrand Reinhold, 1993Availability: Items available for loan: Central Library AIOU Islamabad (1). Location(s): General Stacks 621.381548 HND. Add to cart (remove)
	2.	Practical reliability of electronic equipment and products by Hnatek, Eugene R. Publisher: New York: Marcel Dekker, 2003Availability: Items available for loan: Central Library AIOU Islamabad (1). Location(s): General Stacks 621.381 HNP. Add to cart (remove)

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