Huisman, Leendert M.
Data mining and diagnosing ic fails Leendert M. Huisman - New York: Springer, 2005. - xiv, 270p.
HB
Eng
0387249931
Data mining
Integrated circuits-Testing-Statistical methods
Semiconductors-Failures
Data mining
621.381548 / HUD
Data mining and diagnosing ic fails Leendert M. Huisman - New York: Springer, 2005. - xiv, 270p.
HB
Eng
0387249931
Data mining
Integrated circuits-Testing-Statistical methods
Semiconductors-Failures
Data mining
621.381548 / HUD