| 000 -LEADER |
|---|
| fixed length control field |
00555 a2200193 4500 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| ISBN |
0387249931 |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER |
|---|
| Classification number |
621.381548 |
| Item number |
HUD |
| 100 ## - MAIN ENTRY--AUTHOR NAME |
|---|
| Personal name |
Huisman, Leendert M. |
| 245 ## - TITLE STATEMENT |
|---|
| Title |
Data mining and diagnosing ic fails |
| Statement of responsibility, etc |
Leendert M. Huisman |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) |
|---|
| Place of publication |
New York: |
| Name of publisher |
Springer, |
| Year of publication |
2005. |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Number of Pages |
xiv, 270p. |
| 500 ## - GENERAL NOTE |
|---|
| General note |
HB |
| 546 ## - LANGUAGE NOTE |
|---|
| Language note |
Eng |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical Term |
Data mining |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical Term |
Integrated circuits-Testing-Statistical methods |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical Term |
Semiconductors-Failures |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical Term |
Data mining |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) |
|---|
| Koha item type |
Books |