Data mining and diagnosing ic fails
by Huisman, Leendert M.
Publisher: New York: Springer, 2005Description: xiv, 270p.ISBN: 0387249931.Subject(s): Data mining | Integrated circuits-Testing-Statistical methods | Semiconductors-Failures | Data miningItem type | Location | Call number | Status | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|
Books |
Central Library AIOU Islamabad
General Stacks
Allama Iqbal Open UniversityCentral Library |
621.381548 HUD (Browse shelf) | Available | 110114 |
Total holds: 0
HB
Eng
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