David, Rene
Random testing of digital circuits : theory and applications Rene' David - New York: Marcel Dekker, 1998. - xix, 475p.
HB
Eng
0824701828
Digital integrated ciruits-Testing
621.3815 / DAR
Random testing of digital circuits : theory and applications Rene' David - New York: Marcel Dekker, 1998. - xix, 475p.
HB
Eng
0824701828
Digital integrated ciruits-Testing
621.3815 / DAR