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Random testing of digital circuits : theory and applications

by David, Rene.
Material type: materialTypeLabelBookPublisher: New York: Marcel Dekker, 1998Description: xix, 475p.ISBN: 0824701828.Subject(s): Digital integrated ciruits-Testing
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Central Library AIOU Islamabad

Allama Iqbal Open University

Central Library

General Stacks 		621.3815 DAR (Browse shelf) Available 86959
Total holds: 0

HB

Eng

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