| 000 -LEADER |
|---|
| fixed length control field |
00428nam a2200157Ia 4500 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| ISBN |
0824701828 |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER |
|---|
| Classification number |
621.3815 |
| Item number |
DAR |
| 100 ## - MAIN ENTRY--AUTHOR NAME |
|---|
| Personal name |
David, Rene |
| 245 ## - TITLE STATEMENT |
|---|
| Title |
Random testing of digital circuits |
| Sub Title |
: theory and applications |
| Statement of responsibility, etc |
Rene' David |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) |
|---|
| Place of publication |
New York: |
| Name of publisher |
Marcel Dekker, |
| Year of publication |
1998. |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Number of Pages |
xix, 475p. |
| 500 ## - GENERAL NOTE |
|---|
| General note |
HB |
| 546 ## - LANGUAGE NOTE |
|---|
| Language note |
Eng |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical Term |
Digital integrated ciruits-Testing |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) |
|---|
| Koha item type |
Books |