Electron microscopy and analysis
by
Goodhew, Peter J
.
Material type: 
BookPublisher: London Taylor & Francis 2001Edition: 3rd.Description: vii, 251p.ISBN: 7484-0968-8.Subject(s): Electron microscopy
| Item type | Location | Call number | Status | Date due | Barcode | Item holds |
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| Books |
Central Library AIOU Islamabad
General Stacks
Allama Iqbal Open UniversityCentral Library |
502.825 GOE (Browse shelf) | Available | 101341 |
Total holds: 0
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| 502.82 MOH Hybridizing surface probe microscopies | 502.82 PAN Near-Field optics | 502.82 VOA Atomic force microscopy | 502.825 GOE Electron microscopy and analysis | 502.825 IND Industrial applications of electron microscopy | 502.85 SCI Scientific data management : | 502.85574 RUD Database systems in science and engineering |
Includes bibliographical references and index
eng
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