Production testing of RF and system-on-a-chip devices for wireless communications /
by
Schaub, Keith B
; Kelly, Joe (jt. auth.).
Series: Publisher: Boston : Artech House Publishers, 2004Description: xviii, 272p.ISBN: 1580536921; 9781580536929.Subject(s): Semiconductors-Testing | Wireless communication systems-Equipment and supplies-TestingSummary: With the increasing number of integrated wireless devices being developed with SOC (system on a chip) technology, a merger of RF and mixed-signal test approaches is quickly becoming a necessity. Addressing this need head-on, this first-of-its-kind resource offers you an in-depth overview of RF and SOC product testing for wireless communications. The book introduces new, creative methods that lead to more efficient testing, such as multi-site and parallel testing. You learn how to determine critical measurements for specific applications, including Bluetooth, WLAN, and 3G devices. Moreover, the book shows you how to perform these measurements cost effectively in a production test environment.
| Item type | Location | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|
| Books |
Central Library AIOU Islamabad
General Stacks
Allama Iqbal Open UniversityCentral Library |
621.384134 SCP (Browse shelf) | Available | 110645 |
Total holds: 0
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| 621.384131 LUW Wireless transceiver design | 621.384133 ZAR Resistor theory and technology | 621.384134 BAR Radio valve and semiconductor data | 621.384134 SCP Production testing of RF and system-on-a-chip devices for wireless communications / | 621.384135 BAM Multiantenna wireless communication system | 621.384135 CHB Broadband planar antennas | 621.384135 FOA Advanced array systems, applications and RF technologies |
HB
With the increasing number of integrated wireless devices being developed with SOC (system on a chip) technology, a merger of RF and mixed-signal test approaches is quickly becoming a necessity. Addressing this need head-on, this first-of-its-kind resource offers you an in-depth overview of RF and SOC product testing for wireless communications. The book introduces new, creative methods that lead to more efficient testing, such as multi-site and parallel testing. You learn how to determine critical measurements for specific applications, including Bluetooth, WLAN, and 3G devices. Moreover, the book shows you how to perform these measurements cost effectively in a production test environment.
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